Nanotechnology Research Center succeeds to determine granular size of the Nan particles Minutes atomic force microscope AFM

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Nanotechnology Research Center succeeds to determine granular size of the Nan particles Minutes atomic force microscope AFM
Specialist scientific team in Nanotechnology and advanced materials research center at the University of Technology succeeded the diagnosis and determine the particle size of the nanoparticles minutes using atomic force microscope device Atomic Force Microscope (AFM).
According to the Director of the Nanotechnology Research Center and Advanced Materials Dr. Khaled Ajami Suker that these high-resolution AFM device tests that will contribute to new scientific applications in the field of the use of Nanoparticles minutes in various industrial and medical applications that serve the community. It is worth mentioning that the device atomic force microscope of important devices in the diagnosis of surface compositions of minutes and chips (thin films) and nanomaterials, with a three-dimensional.

Source : Website Section Date :12/12/2016