Nanotechnology Research Center at the University of Technology
Succeeds on Determining Nanoparticles Size, by Atomic Force
Microscope (AFM)
A specialist scientific team in Nanotechnology Research and Advanced
Materials Center managed from the diagnosis and determine the
particle size of the nanoparticles by using the Atomic Force
Microscope (AFM).
Director of Nanotechnology Center Assist.
Prof. Dr. Khalid A. Sukkar, has stated that this high-precision
tests of the AFM device will contribute to new scientific
applications in the field of the use of nanoparticles in various
industrial and medical applications that serve the community. It is
worth mentioning that the AFM is one of important devices in the
diagnosis of surface morphology of the particles, thin films, and
nanomaterials in the three-dimensional form.
