Nanotechnology Research Center at the University of Technology Succeeds on Determining Nanoparticles Size, by Atomic Force Microscope (AFM)

A specialist scientific team in Nanotechnology Research and Advanced Materials Center managed from the diagnosis and determine the particle size of the nanoparticles by using the Atomic Force Microscope (AFM). Director of Nanotechnology Center Assist. Prof. Dr. Khalid A. Sukkar, has stated that this high-precision tests of the AFM device will contribute to new scientific applications in the field of the use of nanoparticles in various industrial and medical applications that serve the community. It is worth mentioning that the AFM is one of important devices in the diagnosis of surface morphology of the particles, thin films, and nanomaterials in the three-dimensional form.

Image result for atomic force microscope diagram 

Date: 5/12/2016