Saturday, 11 July 2020 20:06

Lecturers from Materials Engineering Department at UOT publish a research about (distributed confidence mechanism for malicious behaviors in VANETs) in Science Indonesian Journal of Electrical Engineering and Computer

Lec. Ali K. Ahmed, and Lec. Muhannad N. Abdul Wahid from Materials Engineering Department at UOT a research about (distributed confidence mechanism for malicious behaviors in VANETs) in Science Indonesian Journal of Electrical Engineering and Computer Volume 19, No. 3, page 1147-1155, and the magazine includes within the Scopes container, with an influence factor of 0.209, and serial number 4752-2502

 (VANETs) is one of the most important types of networks that have been widely used in recent years. Along with all the benefits of QoS improvements, the analysis of gapes for this type of network is an important problem. For example, the attack of gray hole reduces network performance. A new solution has been proposed to help secure these networks against this vulnerability. The suggested method can detect and prevent the attack of gray hole anywhere in the network, each (complex) knot can distinguish between the attack of gray hole and a failed link. Some technology information helps us to detect attacks more accurately. Also, the suggested method uses the most reliable path in terms of link failure when there is no malicious node. In this paper, we used the TOPSIS method to select the most reliable node for smart routing. We have validated our suggestion to use a simulation template in a simulator. NS-2 Simulation results show that the proposed method can efficiently prevent the attack gray hole with lower overhead.

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